Atomic Force Microscope (AFM)
MERCELL · 1923415106
Beskrivning
Om upphandlingen
Atomic Force Microscope (AFM) for the characterization of film samples and surfaces under both dry conditions and in liquid environments.<p>General requirements</p><p>Atomic Force Microscope (AFM) for the characterization of film samples and surfaces under both dry conditions and in liquid environments.</p><p>Tenderer's suitability</p><p>Atomic Force Microscope (AFM) for the characterization of film samples and surfaces under both dry conditions and in liquid environments.</p>
Upphandlingsinformation
| Köpare | Chalmers Tekniska Högskola Aktiebolag, GÖTEBORG |
|---|---|
| Org.nr | – |
| Publicerad | 2026-07-21 |
| Sista anbudsdag | – |
| Status | Open |
| Uppskattat värde | – |
CPV och geografi
CPV
38500000Apparater för kontroll och provning
38510000Mikroskop
NUTS / geografi
Mercell saknar geografiinformation.
Leverantörer enligt Mercell
Mercell innehåller inga leverantörsuppgifter.